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參數資料
| 型號： | 5962-9203301MPA |
| 廠商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分類： | 運算放大器 |
| 英文描述： | OP-AMP, 2800 uV OFFSET-MAX, 177 MHz BAND WIDTH, CDIP8 |
| 封裝： | CERDIP-8 |
| 文件頁數： | 1/11頁 |
| 文件大小： | 89K |
| 代理商： | 5962-9203301MPA |
Original Creation Date: 05/16/00
Last Update Date: 05/31/00
Last Major Revision Date:
MNCLC402A-X-RH REV 0A0
MICROCIRCUIT DATA SHEET
LOW-GAIN OP AMP WITH FAST 14-BIT SETTLING: ALSO
AVAILABLE GUARANTEED TO 300K RAD(Si) TESTED TO
MIL-STD-883, METHOD 1019.5
General Description
The CLC402 is an operational amplifier designed for low-gain applications (+ 1 to + 8),
requiring fast, accurate settling and superior DC accuracy.
Settling to 0.0025% in 25ns
(32ns guaranteed over temperature), the CLC402 is ideal as the input amplifier in high
accuracy (up to 14-bits) A/D systems.
Unlike most other high-speed op amps, the CLC402 is
free of thermally induced tails in the settling response.
The CLC402 is an upgrade to, and pin compatible with, the industry standard CLC400.
Constructed using a unique, proprietary design and an advanced complementary bipolar
process, it offers performance far beyond ordinary monolithic op amps.
In addition,
unlike many other high-speed op amps, the CLC402 offers both high performance and
stability without the need for compensation circuitry - even at a gain of + 1.
Supporting the CLC402's excellent pulse performance are improved DC characteristics.
The
CLC402's input offset voltage is typically 0.5mV and is guaranteed to be less than 1.6mV
at +25C.
The input offset voltage drift is typically only 3uV/C.
NS Part Numbers
CLC402AJ-QML
CLC402AJFQML
Industry Part Number
CLC402A
Prime Die
UB1303B
Controlling Document
SEE FEATURES SECTION
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
Temp ( C)
o
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
1
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