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參數資料
型號: WFP75N08
廠商: Wisdom Semiconductor Inc.
英文描述: N-Channel MOSFET
中文描述: N溝道MOSFET
文件頁數: 2/7頁
文件大小: 760K
代理商: WFP75N08
Electrical Characteristics
( T
C
= 25 °C unless otherwise noted )
Symbol
Off Characteristics
Parameter
Test Conditions
Min
Typ
Max
Units
BV
DSS
Drain-Source Breakdown Voltage
V
GS
= 0V, I
D
= 250uA
80
-
-
V
Δ
BV
DSS
/
Δ
T
J
Breakdown Voltage Temperature
coefficient
I
D
= 250uA, referenced to 25 °C
-
0.08
-
V/°C
I
DSS
Drain-Source Leakage Current
V
DS
= 80V, V
GS
= 0V
-
-
10
uA
V
DS
= 64V, T
C
= 125 °C
-
-
100
uA
I
GSS
Gate-Source Leakage, Forward
V
GS
= 20V, V
DS
= 0V
-
-
100
nA
Gate-source Leakage, Reverse
V
GS
= -20V, V
DS
= 0V
-
-
-100
nA
On Characteristics
V
GS(th)
Gate Threshold Voltage
V
DS
= V
GS
, I
D
= 250uA
2.0
-
4.0
V
R
DS(ON)
Static Drain-Source On-state Resis-
tance
Dynamic Characteristics
V
GS
=10 V, I
D
= 37.5A
-
0.012
0.015
C
iss
Input Capacitance
V
GS
=0 V, V
DS
=25V, f = 1MHz
-
2600
3380
pF
C
oss
C
rss
Output Capacitance
-
940
1220
Reverse Transfer Capacitance
Dynamic Characteristics
-
210
275
t
d(on)
t
r
t
d(off)
t
f
Q
g
Q
gs
Turn-on Delay Time
V
DD
=40V, I
D
=75A, R
G
=25
(Note 4, 5)
-
30
70
ns
Rise Time
-
225
460
Turn-off Delay Time
-
165
340
Fall Time
-
155
320
Total Gate Charge
V
DS
=64V, V
GS
=10V, I
D
=75A
(Note 4, 5)
-
80
105
nC
Gate-Source Charge
-
15
-
Q
gd
Gate-Drain Charge(Miller Charge)
-
32
-
Source-Drain Diode Ratings and Characteristics
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit.
I
S
I
SM
V
SD
Continuous Source Current
Integral Reverse p-n Junction
Diode in the MOSFET
-
-
75
A
Pulsed Source Current
-
-
300
Diode Forward Voltage
I
S
=75A, V
GS
=0V
-
-
1.5
V
t
rr
Reverse Recovery Time
I
S
=75A, V
GS
=0V, dI
F
/dt=100A/us
-
90
-
ns
Q
rr
Reverse Recovery Charge
-
250
-
uC
WFP75N08
NOTES
1. Repeativity rating : pulse width limited by junction temperature
2. L = 0.32mH, I
AS
=75A, V
DD
= 25V, R
G
= 25
, Starting T
J
=
25°C
3. I
SD
75A, di/dt
300A/us, V
DD
BV
DSS
, Starting T
J
=
25°C
4. Pulse Test : Pulse Width
300us, Duty Cycle
2%
5. Essentially independent of operating temperature.
Copyright@Wisdom Semiconductor Inc., All rights reserved.
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